Inventor · Mason, OH, US

Kangming Ma

1Patents
1h-index
3Co-inventors
25Inventor score

Filing activity: Feb 13, 2003 → Feb 13, 2003

Most-cited inventions

PatentTitleAreaCited byStatus
US6872946B2 Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate Physics 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.