Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate
US6872946B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 13, 2003 |
| Grant date | Mar 29, 2005 |
| Priority date | — |
| Expiry date | Sep 21, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8592
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process for detecting low levels of a predetermined quality trait present in an inhomogeneously distributed particulate substrate involving the steps of: (a) providing a particulate substrate to be analyzed; (b) providing a spectrometer with an electromagnetic detector capable of performing spectroscopic measurements with electromagnetic radiation; (c) providing a rotatable sample holder having a transparent area through which electromagnetic radiation may pass; (d) providing a tumbling member located within the rotatable sample holder for tumbling the particulate substrate contained therein; (e) introducing the particulate substrate into the rotatable sample holder; (f) simultaneously rotating and tumbling the particulate substrate contained within the rotatable sample holder; and (g) activating the spectrometer, thereby illuminating the particulate substrate contained within the rotatable sample holder with electromagnetic radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.