Kanji Kinameri
3Patents
2h-index
8Co-inventors
30Inventor score
Filing activity: Apr 8, 1985 → Apr 27, 1987
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4731855A | Pattern defect inspection apparatus | Electricity | 52 | Expired |
| US4702607A | Three-dimensional structure viewer and method of viewing three-dimensional structure | Physics | 9 | Expired |
| US4791288A | Scanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrents | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.