Scanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrents
US4791288A · kind A · utility
2Cited by
3References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 27, 1987 |
| Grant date | Dec 13, 1988 |
| Priority date | — |
| Expiry date | Apr 27, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The scanning photon microscope according to this invention relates the phase of the ac photovoltage or photocurrent signal to the hue of a color image and the amplitude of the signal to the brightness of the image in representing the signal distribution in the specimen in the form of a color image, in order to make a clear distinction between the amplitude and phase of the ac photovoltage or photocurrent induced in the specimen when irradiated with a photon beam, thus permitting detailed and multilateral analysis of the specimen's characteristics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.