Kaori Bizen
6Patents
1h-index
13Co-inventors
40Inventor score
Filing activity: Aug 25, 2017 → Oct 8, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11251018B2 | Scanning electron microscope | Electricity | 2 | Active |
| US11276554B2 | Scanning electron microscope and method for measuring pattern | Electricity | 1 | Active |
| US11435178B2 | Calibration sample, electron beam adjustment method and electron beam apparatus using same | Electricity | 0 | Active |
| US10636618B2 | Charged particle beam apparatus | Electricity | 0 | Active |
| US11456150B2 | Charged particle beam device | Electricity | 0 | Active |
| US11610756B2 | Charged particle beam apparatus and control method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.