Karsten Peukert
1Patents
1h-index
—Co-inventors
19Inventor score
Filing activity: Jun 25, 2004 → Jun 25, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7274867B2 | System and method for determining the temperature of a semiconductor wafer | Physics | 455 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.