Keiichi Enjoji
2Patents
1h-index
6Co-inventors
30Inventor score
Filing activity: Jun 12, 2002 → Mar 2, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7726190B2 | Device, method and program for inspecting microstructure | Physics | 5 | Active |
| US7237606B2 | Wafer supporter | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.