Keith White
3Patents
2h-index
7Co-inventors
33Inventor score
Filing activity: Jun 6, 1994 → Mar 28, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6404250B1 | On-chip circuits for high speed memory testing with a slow memory tester | Electricity | 18 | Expired |
| US6477095B2 | Method for reading semiconductor die information in a parallel test and burn-in system | Electricity | 5 | Expired |
| US5503567A | Termination module | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.