Method for reading semiconductor die information in a parallel test and burn-in system
US6477095B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 28, 2000 |
| Grant date | Nov 5, 2002 |
| Priority date | — |
| Expiry date | Jan 25, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2223/5444
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method according to the present invention is provided for determining memory device identification. The method invokes a serial output from n identification fuses of two or more memory devices, the output for identifying the device, and sampling the serial output every nth bit to determine a fuse state for a fuse of each device. The method further repeats the sampling for all n fuses to acquire fuse data for all devices, and determines a pass/fail string corresponding to the sampled output, the pass/fail string being employed to identify the devices through a parallel test and burn-in system. The output is on an enabled data line which is used during the burn-in test wherein other data lines are disabled for avoiding bus contention. The method also includes storing the pass/fail string for the data in a database, and translating the pass/fail string using a structured query language expression executed against the database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.