Inventor · San Jose, CA, US

Kieu Do

14Patents
4h-index
7Co-inventors
53Inventor score

Filing activity: Feb 19, 1992 → Nov 3, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US5353235A Wire length minimization in channel compactor Physics 50 Expired
US5399517A Method of routing three layer metal gate arrays using a channel router Emerging Cross-Sectional Technologies 14 Expired
US9316689B2 Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models Physics 10 Active
US9874608B2 Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models Physics 5 Active
US9651619B2 Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models Physics 4 Active
US9689921B2 Testing SoC with portable scenario models and at different levels Physics 2 Active
US10365326B2 Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models Physics 2 Active
US9310433B2 Testing SOC with portable scenario models and at different levels Physics 1 Active
US11748240B2 Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models Physics 0 Active
US9360523B2 Display in a graphical format of test results generated using scenario models Physics 0 Active
US10429442B2 Testing SOC with portable scenario models and at different levels Physics 0 Active
US10838006B2 Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models Physics 0 Active
US11113184B2 Display in a graphical format of test results generated using scenario models Physics 0 Active
US11055212B2 Testing SoC with portable scenario models and at different levels Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.