Koichiro Eguchi
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Mar 2, 2006 → Mar 2, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7668027B2 | Semiconductor device, testing and manufacturing methods thereof | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.