Kyle Babinski
2Patents
0h-index
7Co-inventors
21Inventor score
Filing activity: Dec 23, 2014 → Dec 11, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9330988B1 | Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness | Electricity | 0 | Active |
| US9576863B2 | Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.