Laurent Hermans
3Patents
1h-index
8Co-inventors
33Inventor score
Filing activity: Apr 12, 2011 → Dec 30, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9140546B2 | Apparatus and method for three dimensional inspection of wafer saw marks | Physics | 1 | Active |
| US9103665B2 | Apparatus and method for three dimensional inspection of wafer saw marks | General | 0 | Revoked |
| US10215560B2 | Method for shape classification of an object | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.