Lawrence Fischer
4Patents
3h-index
5Co-inventors
36Inventor score
Filing activity: Oct 15, 2001 → Jul 8, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6670717B2 | Structure and method for charge sensitive electrical devices | Electricity | 7 | Expired |
| US6858530B2 | Method for electrically characterizing charge sensitive semiconductor devices | Electricity | 7 | Expired |
| US6987067B2 | Semiconductor copper line cutting method | Electricity | 5 | Expired |
| US6946064B2 | Sample mount for performing sputter-deposition in a focused ion beam (FIB) tool | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.