Leo Raymond Buda
1Patents
1h-index
11Co-inventors
29Inventor score
Filing activity: May 3, 2000 → May 3, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6414509B1 | Method and apparatus for in-situ testing of integrated circuit chips | Electricity | 10 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.