Leonid A. Vasilyev
5Patents
3h-index
11Co-inventors
50Inventor score
Filing activity: Jul 9, 1999 → Dec 5, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6399944B1 | Measurement of film thickness by inelastic electron scattering | Physics | 59 | Expired |
| US8299416B2 | High speed quantum efficiency measurement apparatus utilizing solid state lightsource | Emerging Cross-Sectional Technologies | 8 | Active |
| US8278937B2 | High speed detection of shunt defects in photovoltaic and optoelectronic devices | Emerging Cross-Sectional Technologies | 6 | Active |
| US6635869B2 | Step function determination of Auger peak intensity | Physics | 0 | Expired |
| US9537444B2 | Methods and systems for characterizing photovoltaic cell and module performance at various stages in the manufacturing process | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.