Let-Long Chen
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Mar 4, 2004 → Mar 4, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7123040B2 | System and method for check-in control in wafer testing | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.