Liangjiang YU
3Patents
0h-index
6Co-inventors
24Inventor score
Filing activity: Dec 18, 2019 → Aug 3, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11769317B2 | Fully automated SEM sampling system for e-beam image enhancement | Physics | 0 | Active |
| US11694312B2 | Image enhancement for multi-layered structure in charged-particle beam inspection | Electricity | 0 | Active |
| US12230013B2 | Fully automated SEM sampling system for e-beam image enhancement | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.