Lin Jing
5Patents
1h-index
12Co-inventors
44Inventor score
Filing activity: Aug 2, 2007 → Oct 19, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8401272B2 | Patterned wafer defect inspection system and method | Physics | 1 | Active |
| US11493288B2 | Nanowire-based thermal interface | Performing Operations; Transporting | 0 | Active |
| US11933549B2 | Nanowire-based thermal interface | Performing Operations; Transporting | 0 | Active |
| US11946213B1 | High-speed train derailment arresting system and structural design method therefor | Emerging Cross-Sectional Technologies | 0 | Active |
| US10161881B2 | System and method for inspecting a wafer | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.