Lior Yaron
3Patents
0h-index
11Co-inventors
28Inventor score
Filing activity: May 18, 2020 → Mar 18, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11921063B2 | Lateral recess measurement in a semiconductor specimen | Electricity | 0 | Active |
| US11264202B2 | Generating three dimensional information regarding structural elements of a specimen | Electricity | 0 | Active |
| US11662324B1 | Three-dimensional surface metrology of wafers | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.