Luai Nasser
3Patents
1h-index
10Co-inventors
37Inventor score
Filing activity: Dec 17, 2004 → Nov 2, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7542134B2 | System, method and apparatus for in-situ substrate inspection | Physics | 2 | Active |
| US7397555B2 | System, method and apparatus for in-situ substrate inspection | Physics | 1 | Expired |
| US9007079B2 | System and method for compensating measured IDDQ values | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.