Luca Bortesi
1Patents
0h-index
2Co-inventors
16Inventor score
Filing activity: Apr 30, 2004 → Apr 30, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7352192B2 | Method and relative test structure for measuring the coupling capacitance between two interconnect lines | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.