Lucio Cozzi
2Patents
2h-index
—Co-inventors
24Inventor score
Filing activity: Jul 15, 1987 → Oct 17, 1988
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4871963A | Method and apparatus for testing EPROM type semiconductor devices during burn-in | Physics | 56 | Expired |
| US4799021A | Method and apparatus for testing EPROM type semiconductor devices during burn-in | Physics | 17 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.