Ludwig Listl
6Patents
2h-index
13Co-inventors
48Inventor score
Filing activity: Nov 10, 1997 → Oct 22, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6333992A | Defect judgement processing method and apparatus | Physics | 23 | Expired |
| US6249598A | Solder testing apparatus | Physics | 8 | Expired |
| US11073472B2 | Methods and apparatus for characterizing a specimen using pattern illumination | Physics | 2 | Active |
| US7791714B2 | Device and method for recording distance-measuring images | Physics | 1 | Active |
| US11815446B2 | Methods and apparatus for characterizing a specimen container and specimen | Physics | 0 | Active |
| US12253533B2 | Methods and apparatus providing calibration of background illumination for sample and/or sample container characterization | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.