Methods and apparatus for characterizing a specimen using pattern illumination

US11073472B2 · kind B2 · utility

Assignee

• Siemens Healthcare Diagnostics Inc. · US

Inventors

• Patrick Wissmann · Munich, DE
• Ludwig Listl · Munich, DE
• Benjamin S. Pollack · Budd Lake, US

Key dates

• Filing date: Nov 13, 2017
• Grant date: Jul 27, 2021
• Expiry date: Mar 13, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/30072
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A characterization apparatus including pattern generation. The characterization apparatus is configured to characterize a specimen and/or a specimen container in some embodiments. The characterization apparatus includes an imaging location configured to receive a specimen container containing a specimen, one or more image capture devices located at one or more viewpoints adjacent to the imaging location, and one or more light panel assemblies including pattern generation capability located adjacent to the imaging location and configured to provide back lighting. Methods of imaging a specimen and/or specimen container using the pattern generation are described herein, as are other aspects.