Marinus Kunst
2Patents
2h-index
6Co-inventors
27Inventor score
Filing activity: Jan 25, 1985 → Feb 28, 1985
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4704576A | Microwave measuring and apparatus for contactless non-destructive testing of photosensitive materials | Physics | 27 | Expired |
| US4700311A | System for optimizing process parameters in photoactive semiconductor manufacturing in-situ | Emerging Cross-Sectional Technologies | 7 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.