Mark Alan Kramer
3Patents
2h-index
4Co-inventors
41Inventor score
Filing activity: Dec 9, 1993 → Oct 7, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5335291A | Method and apparatus for pattern mapping system with self-reliability check | Physics | 71 | Expired |
| US6421185B1 | Wide field-of-view imaging system using a spatial light modulator | Physics | 40 | Expired |
| US11445960B2 | Electrography system employing layered electrodes for improved spatial resolution | Human Necessities | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.