Method and apparatus for pattern mapping system with self-reliability check
US5335291A · kind A · utility
71Cited by
5References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 9, 1993 |
| Grant date | Aug 2, 1994 |
| Priority date | — |
| Expiry date | Dec 9, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/09
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A pattern mapping system provides indication of reliability of pattern or category selection indicated by output nodes. The indication of reliability includes a quantitative indication of error in the output and an indication when training is insufficient for the system to respond to the input pattern accurately. The error indication is based on error in the outputs produced by the system as trained in response to given inputs, and accuracy of fit of training data to the output. The insufficiency of the mapping system as trained is determined according to training data density local to the subject input pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.