Mark Lambert
6Patents
3h-index
16Co-inventors
54Inventor score
Filing activity: Jan 31, 2000 → Oct 8, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6614458B1 | Method and apparatus for displaying and manipulating multiple geometric constraints of a mechanical design | Emerging Cross-Sectional Technologies | 64 | Expired |
| US7643968B1 | Method and apparatus for simplified patterning of features in a computer aided design (CAD) model | Physics | 6 | Expired |
| US10462893B2 | Method and system for surface modification of substrate for ion beam target | Human Necessities | 6 | Active |
| US6925344B1 | Maintaining segmentation of geometry pieces in a computer aided design (CAD) environment | Physics | 2 | Expired |
| US8168941B2 | Ion beam angle calibration and emittance measurement system for ribbon beams | Electricity | 1 | Active |
| US11553584B2 | Method and system for surface modification of substrate for ion beam target | Human Necessities | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.