Mark Plemmons
2Patents
2h-index
6Co-inventors
37Inventor score
Filing activity: Jul 15, 2004 → Apr 7, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7280200B2 | Detection of a wafer edge using collimated light | Physics | 16 | Expired |
| US9702829B1 | Systems and methods for wafer surface feature detection and quantification | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.