Mark Westerhaus
5Patents
3h-index
4Co-inventors
50Inventor score
Filing activity: Aug 29, 1986 → Apr 27, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4866644A | Optical instrument calibration system | Physics | 110 | Expired |
| US6560546B1 | Remote analysis system | Electricity | 37 | Expired |
| US5798526A | Calibration system for spectrographic analyzing instruments | Physics | 12 | Expired |
| US7486388B2 | Method and apparatus for standardization of a measuring instrument | Physics | 1 | Active |
| US7227623B2 | Method and apparatus for standardization of a measuring instrument | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.