Patent · US Expired

Method and apparatus for standardization of a measuring instrument

US7227623B2 · kind B2 · utility

1Cited by
25References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 2002
Grant dateJun 5, 2007
Priority date
Expiry dateAug 14, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0221
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method, a portable device and a measuring instrument for standardization of a satellite measuring instrument to a corresponding master measuring instrument are disclosed. The portable device includes a device for containing a reference material, and an information unit for storing information about the reference material and measurements of the reference material on the master measuring instrument. When placed in a satellite measuring instrument, information from the master instrument stored in the information unit of the portable device is transmitted automatically and wirelessly to the satellite instrument and, together with measurements by the satellite instrument of the reference masterial in the portable device, a standardization model for the satellite instrument and the sample type is obtained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.