Markus Bartscher
3Patents
1h-index
5Co-inventors
30Inventor score
Filing activity: Oct 29, 2015 → Feb 2, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10983072B2 | Method for dimensional x-ray measurement, in particular by computed tomography, and x-ray computed tomography scanner | Physics | 1 | Active |
| US11047810B2 | Method for monitoring the functional state of a system for computer-tomographic examination of workpieces | Electricity | 1 | Active |
| US10572987B2 | Determination of localised quality measurements from a volumetric image record | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.