Marvin Klein
29Patents
11h-index
43Co-inventors
75Inventor score
Filing activity: Apr 8, 1980 → Jan 4, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5585921A | Laser-ultrasonic non-destructive, non-contacting inspection system | Physics | 66 | Expired |
| US6008887A | Single beam laser surface velocity and displacement measurement apparatus | Physics | 37 | Expired |
| US5684592A | System and method for detecting ultrasound using time-delay interferometry | Physics | 33 | Expired |
| US7278315B1 | Laser-ultrasonic detection of subsurface defects in processed metals | Physics | 26 | Expired |
| US5717516A | Hybrid laser power combining and beam cleanup system using nonlinear and adaptive optical wavefront compensation | Physics | 25 | Expired |
| US5900935A | Homodyne interferometer and method of sensing material | Physics | 24 | Expired |
| US4739496A | Associative holographic memory apparatus employing phase conjugate mirrors | Physics | 21 | Expired |
| US6837109B2 | Material thickness measurement method and apparatus | Physics | 17 | Expired |
| US4773739A | Self-pumped phase conjugate mirror and method using AC-field enhanced photorefractive effect | Physics | 16 | Expired |
| US5391329A | Process for making a solid optical limiter containing a graded distribution of reverse saturable material | Performing Operations; Transporting | 13 | Expired |
| US7117741B2 | Method and device for ultrasonic vibration detection during high-performance machining | Physics | 11 | Expired |
| US5130849A | Method and apparatus for energy transfers between optical beams using near-bandgap electrorefractive effect | Physics | 10 | Expired |
| US4720176A | Erase beam apparatus and method for spatial intensity threshold detection | Physics | 9 | Expired |
| US8269979B2 | Device for laser-ultrasonic detection of flip chip attachment defects | Physics | 8 | Active |
| US6342721B1 | Enhanced non-steady-state photo-induced electromotive force detector | Electricity | 7 | Expired |
| US7327448B2 | Laser-ultrasonic detection of flip chip attachment defects | Physics | 6 | Expired |
| US8243280B2 | Laser ultrasonic measurement system with movable beam delivery | Physics | 6 | Active |
| US5847851A | Double-doped BaTiO.sub.3 crystal for holographic storage | Physics | 5 | Expired |
| US4291950A | Electro-optic devices using Stark-induced birefringence and dichroism | Physics | 4 | Expired |
| US6496268B1 | Laser-based glass thickness measurement system and method | Physics | 4 | Expired |
| US5729375A | Optical amplification system with non-orthogonal signal and distributed multi-pump beams and photorefractive cleanup | Electricity | 4 | Expired |
| US10184858B2 | Visually inspecting optical fibers | Physics | 3 | Active |
| US6818880B2 | Enhanced photo-EMF sensor with high bandwidth and large field of view | Electricity | 1 | Expired |
| US7701027B1 | Method and apparatus for reduction of non-adaptive signals in photo-EMF sensors | Physics | 1 | Active |
| US10527510B2 | System, probe and method for measurement of fastener loading | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.