Masaaki Mutoh
1Patents
1h-index
8Co-inventors
25Inventor score
Filing activity: Jul 6, 1990 → Jul 6, 1990
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5219765A | Method for manufacturing a semiconductor device including wafer aging, probe inspection, and feeding back the results of the inspection to the device fabrication process | Emerging Cross-Sectional Technologies | 124 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.