Masayasu Katayama
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Feb 22, 1995 → Feb 22, 1995
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5534786A | Burn-in and test method of semiconductor wafers and burn-in boards for use in semiconductor wafer burn-in tests | Physics | 42 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.