Mathias Beck
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Feb 2, 1999 → Feb 2, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6323953A | Method and device for measuring structures on a transparent substrate | Physics | 20 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.