Matthew Weldon
8Patents
5h-index
9Co-inventors
52Inventor score
Filing activity: Jun 16, 1998 → May 22, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7342235B1 | Contamination monitoring and control techniques for use with an optical metrology instrument | Physics | 20 | Active |
| US6447370B1 | Inline metrology device | Electricity | 14 | Expired |
| US6960115B2 | Multiprobe detection system for chemical-mechanical planarization tool | Electricity | 11 | Expired |
| US6805613B1 | Multiprobe detection system for chemical-mechanical planarization tool | Electricity | 9 | Expired |
| US5942704A | Brush plectrum for stringed instruments | Physics | 5 | Expired |
| US8153987B2 | Automated calibration methodology for VUV metrology system | Physics | 3 | Active |
| US7622310B2 | Contamination monitoring and control techniques for use with an optical metrology instrument | Physics | 2 | Active |
| US7663747B2 | Contamination monitoring and control techniques for use with an optical metrology instrument | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.