Inventor · Akiruno, JP

Mayumi ODAIRA

8Patents
2h-index
4Co-inventors
33Inventor score

Filing activity: Nov 17, 2017 → Mar 8, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US10458781B2 Sample shape measuring method and sample shape measuring apparatus Physics 3 Active
US10458785B2 Sample shape measuring method and sample shape measuring apparatus Physics 2 Active
US10697764B2 Sample shape measuring apparatus for calculating a shape of a sample disposed between an illumination optical system and an observation optical system Physics 1 Active
US10983055B2 Sample observation apparatus Physics 1 Active
US10539411B2 Sample shape measuring apparatus Physics 1 Active
US11965830B2 Data acquisition apparatus Physics 0 Active
US11150459B2 Sample observation device with focusing function Physics 0 Active
US11808931B2 Image pickup apparatus with rotation unit Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.