Meng Ku Chi
2Patents
1h-index
4Co-inventors
30Inventor score
Filing activity: Nov 24, 2020 → Aug 9, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11816411B2 | Method and system for semiconductor wafer defect review | Physics | 2 | Active |
| US12190036B2 | Method and system for semiconductor wafer defect review | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.