Inventor · Woodinville, WA, US

Michael Daub

6Patents
1h-index
14Co-inventors
44Inventor score

Filing activity: Aug 22, 2007 → Jan 31, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US8326565B2 Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under test Physics 3 Active
US11790116B2 Systems and methods for privacy preserving determination of intersections of sets of user identifiers Electricity 1 Active
US12205197B1 Label image synthesis using generative AI Physics 0 Active
US12124611B2 Systems and methods for privacy preserving determination of intersections of sets of user identifiers Electricity 0 Active
US12412069B1 Cookie space domain adaptation for device attribute prediction Physics 0 Active
US11334684B2 Systems and methods for privacy preserving determination of intersections of sets of user identifiers Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.