Inventor · Bolton, CT, US

Michael J. Giering

20Patents
4h-index
33Co-inventors
59Inventor score

Filing activity: Dec 12, 2011 → Apr 26, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US10409275B2 Oil debris monitoring (ODM) with adaptive learning Emerging Cross-Sectional Technologies 6 Active
US11422546B2 Multi-modal sensor data fusion for perception systems Physics 6 Active
US10160550B1 Ice detection and real time ice estimation using innovative sensor data learning approaches Physics 5 Active
US9977409B2 SPC fault detection and diagnostics algorithm Mechanical Engineering; Lighting; Heating 4 Active
US11340602B2 Sensor data fusion for prognostics and health monitoring Physics 2 Active
US10776659B2 Systems and methods for compressing data Electricity 1 Active
US10860879B2 Deep convolutional neural networks for crack detection from image data Physics 1 Active
US11080974B2 Selective intrusion detection systems Electricity 1 Active
US11776368B2 Selective intrusion detection systems Electricity 1 Active
US11676009B2 Machine learning based rotor alloy design system Physics 0 Active
US10388005B2 Sensor system for data enhancement Physics 0 Active
US10733721B2 Automated material characterization system including conditional generative adversarial networks Physics 0 Active
US11062207B2 Control systems using deep reinforcement learning Physics 0 Active
US11397134B2 Intelligent learning device for part state detection and identification Physics 0 Active
US11485520B2 Material selection and optimization process for component manufacturing Physics 0 Active
US11248989B2 System and method for analyzing engine test data in real time Physics 0 Active
US10452951B2 Active visual attention models for computer vision tasks Electricity 0 Active
US10387803B2 Sensor system for transcoding data Physics 0 Active
US11988602B2 Surface plasmon resonance detection system Physics 0 Active
US10430937B2 Automated material characterization system including conditional generative adversarial networks Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.