Automated material characterization system including conditional generative adversarial networks
US10733721B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2019 |
| Grant date | Aug 4, 2020 |
| Priority date | — |
| Expiry date | Aug 23, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30242
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A material characterization system includes an imaging unit, a material characterization controller, and an imaging unit controller. The electronic imaging unit generates a test image of a specimen composed of a material. The electronic material characterization controller determines values of a plurality of parameters and maps the parameters to corresponding ground truth labeled outputs. The mapped parameters are applied to at least one test image to predict a presence of at least one target attribute of the specimen in response to applying the learned parameters. The test image is convert to a selected output image format so as to generate a synthetic image including the predicted at least one attribute. The electronic imaging unit controller performs a material characterization analysis that characterizes the material of the specimen based on the predicted at least one attribute included in the synthetic image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.