Michael Kupniewski
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Jul 2, 2015 → Jul 2, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9791504B2 | Contactor arrangement, IC test handler and IC test arrangement | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.