Patent · US Active

Contactor arrangement, IC test handler and IC test arrangement

US9791504B2 · kind B2 · utility

1Cited by

3References

16Claims

0Family size

Assignee

RASCO GMBH · DE

Inventors

Michael Kupniewski · Kolbermoor, DE
Christian Wammetsberger · Kolbermoor, DE
Josef Mayer · Rosenheim, DE
Rainer HITTMANN · Großkarolinenfeld, DE

Key dates

Filing date	Jul 2, 2015
Grant date	Oct 17, 2017
Priority date	—
Expiry date	Dec 16, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2889
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Contactor arrangement of an IC test handler, comprising: a contactor unit which has test contacts for contacting an IC in test and for temporarily pressing the IC against the test contacts, a plunger head, which has a recessed central region corresponding to the geometrical configuration of the IC, such that those surface of the IC which is adjacent to the upper surface of the plunger head does not touch the plunger head surface, and a contactor unit interface, which includes a vacuum suction system for actively attracting the IC to an IC contact surface of the contactor unit interface, that corresponds with an adjacent surface of the IC having IC device contacts and, thus, towards the test contacts of the contactor unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.