Michael Sweeney
4Patents
2h-index
8Co-inventors
37Inventor score
Filing activity: Sep 5, 1997 → Dec 28, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7113276B1 | Micro defects in semi-conductors | Physics | 27 | Expired |
| US7446868B1 | Micro defects in semi-conductors | Physics | 20 | Active |
| US9849562B2 | And manufacture of an abrasive polishing tool | Performing Operations; Transporting | 0 | Active |
| US7713404B2 | Monitoring apparatus and method for improving the accuracy and repeatability of electrochemical capacitance voltage (ECV) measurements | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.