Michael T. Coster
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Jun 12, 2013 → Jun 12, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9269642B2 | Methods for testing integrated circuits of wafer and testing structures for integrated circuits | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.