Michael Vainer
6Patents
2h-index
7Co-inventors
36Inventor score
Filing activity: Aug 24, 2006 → Jan 21, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8281674B2 | Wafer inspection system and a method for translating wafers [PD] | Physics | 3 | Active |
| US8225701B2 | Tyre segmenting device | Emerging Cross-Sectional Technologies | 3 | Active |
| US9258134B2 | System and method for recording communication interaction over a mobile device | Electricity | 1 | Active |
| US9713883B2 | Method and device for polymer pulverisation extrusion | Emerging Cross-Sectional Technologies | 1 | Active |
| US9546258B2 | Utilization of gasses for polymeric materials fragmentation and activation and related device | Emerging Cross-Sectional Technologies | 0 | Active |
| US8573077B2 | Wafer inspection system and a method for translating wafers | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.