Michel Egee
1Patents
1h-index
6Co-inventors
25Inventor score
Filing activity: Feb 5, 1987 → Feb 5, 1987
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4875175A | Method and device for analyzing and measuring physical parameters of a layered material by thermal radiometry | Physics | 13 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.