Method and device for analyzing and measuring physical parameters of a layered material by thermal radiometry
US4875175A · kind A · utility
13Cited by
4References
22Claims
0Family size
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Key dates
| Filing date | Feb 5, 1987 |
| Grant date | Oct 17, 1989 |
| Priority date | — |
| Expiry date | Feb 5, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and a device are used to analyze and measure by means of radiometry physical parameters of a layered material. These parameters include the absorptivity B, the diffusivity A of the surface layer and the thermal resistance R of the interface between the two layers. A sample of the material is excited by means of a flux of thermal energy amplitude modulated at a high frequency and a low frequency. The parameters are computed from the measured phase shift and amplitude of the resulting thermal signal. The method and the device are applicable to non-destructive testing of industrial products.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.